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Microtest Unveils New Test Generator at PCIM Exhibition

by sthv

At the recent PCIM exhibition in Nuremberg, Germany, the Microtest Group, a European manufacturer of testing systems, unveiled its latest product: the M2 DS5 Quasar. This compact, 2kA low inductance dynamic switch test generator is designed for testing power chips, including the latest SiC (Silicon Carbide) and GaN (Gallium Nitride) devices, as well as rad-hard devices for space and defense applications.

The M2 DS5 Quasar was developed by ipTEST, a UK-based subsidiary of Microtest. Microtest acquired ipTEST in 2024 through a deal led by Xenon Private Equity. The company claims that the new test generator is a significant improvement over previous models. It offers eight times better efficiency in overcurrent protection, thanks to its SocketSafe technology, and has a typical response time of under 300 nanoseconds. Additionally, the device’s parasitic inductance has been reduced by 85%, bringing it down to just 30nH.

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Conor McCarthy, Managing Director of ipTEST, expressed excitement about the new product: “We are delighted to present this innovative new product to the market. It is the result of a year of hard work and dedication in research and development. The new tester supports a wide range of products and is designed with maximum operational efficiency in mind. This allows us to strengthen our position in highly strategic sectors like space, which continue to grow in importance.”

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